Single-event Latchup (SEL) is a radiation effect of concern in space environments that can cause high currents to flow through parasitic thyristors in CMOS devices, resulting in permanent device or system failure. Most commonly cited SEL protection schemes rely on silicon level IC design, or custom and often unavailable parts. This paper presents a simple SEL protection scheme composed from COTS parts, designed to switch power to existing systems or subsystems and provide Latchup protection. The circuit itself is designed completely from bipolar technology to ensure it is not susceptible to SEL itself and takes only 2.75 square cm of board space per two protection units. This circuit senses an overcurrent condition caused by a SEL, then powers down and discharges the load to remove the Latchup. This event can be logged by an external monitoring circuit or microcontroller. After a set time, power is reapplied, and normal operation can continue.